With its unique and innovative design, the Bettersizer S3筋斗云体育 combines the measurement methods of static light scattering and dynamic image analysis for measuring particle size from the nanometer to the millimeter range.
using the patented dlois technology, even nanoparticles (from 10 nm onward) can reliably be characterized. the additional lens between the laser and the measurement chamber enables the detection of the backscattered light. the use of only one laser with oblique incidence of light provides a continuous scattering spectrum with consistent wavelength and allows the detection in a continuous angle range up to 165°.
筋斗云体育since the maximal intensity of the scattered light of large particles can only be detected at very small angles, the classical static light scattering cannot analyze those particles sufficient enough. the image analysis system of the bettersizer s3 enables, in contrast to other laser diffraction systems, the reliable detection of larger particles thanks to particle detection by camera and thus allows realistic measurements up to 3.5 mm.
Bettersizer S3 – Scheme of Optical Bench
筋斗云体育/1/ iso 13320 particle size analysis – laser diffraction methods
With the solvent resistance option and the additional dispersion unit BT-800N, measurements can be performed in all common solvents on the Bettersizer S3. The reduced bath volume compared to the standard dispersing unit enables economical use of solvents, the modular design of the measuring system and the self-sufficient operation of the dispersing unit BT-800N guarantees a quick and easy exchange of the dispersing modules without inconvenient cleaning or further modifications to hardware and software. Analogous to the standard dispersion, a visible sample preparation by stirring and ultrasonic is possible.
The external small-volume cell筋斗云体育 is ideally suitable for reproducible particle size measurement in polar and non-polar solvents. Due to the small amount of liquid, solvent consumption is low. The effective and controllable ultrasonic irradiation enables the measurement of systems that are difficult to disperse or tend to reagglomeration.
Cleaning and changing samples or solvents is very easy thanks to the quick release system. The sample feed to the Bettersizer S3 is carried out via a solvent-resistant hose and is manually controlled.
|Bettersizer S3 Plus||Static light scattering and Dynamic image analysis 0.01 – 3500 µm|
|Bettersizer 2600||Static light scattering 0.02 – 2600 µm|
|Bettersizer ST||Static Light Scattering 0.1 – 1000 µm|
|Nanoptic 90||Dynamic light scattering 1 nm – 9.5 µm|
|BeVision D2||Dynamic image analysis 2 µm – 10.000 µm|
|DT-100||Acoustic attenuation spectroscopy 5 nm – 1000 µm|
|DT-1202||Acoustic attenuation spectroscopy 5 nm – 1000 µm|